Scanning Acoustic Microscope (SAM)
Description
The Scanning Acoustic Microscope (SAM) Insight IS-202 is an inspection system for non-destructive analysis and failure detection in microelectronic devices, materials and surface interfaces.
Specifications
- PC-controlled operation
- Active scanning area: 200 mm x 150 mm x 50 mm
- Transmission and reflection modes
- Moving speed: at least 10 mm/s
- Accuracy and repeatability for X, Y, Z: better than 0.01 mm
- Transducers: low and medium frequency (10 and 35 MHz) and high and ultra-high frequency (75 and 110 MHz).
Applications
The Scanning Acoustic Microscope Insight IS-202 is a PC-controlled inspection system for non-destructive analysis and failure detection in the following fields:
- Microelectronic and semiconductor devices, microsystems and MEMS (CSP and flip-chip underfill, void and delamination analysis, integrity evaluation, internal defect detection)
- Materials science, including heterogeneous and composite materials and systems (inclusion, crack and void detection in metals, plastics, resin, void evaluation)
- Interface analysis (delamination of composite materials, interface analysis on heterogeneous assemblies).
