Thermal imaging system

Thermal imaging system

Description

Thermal imaging system Sentris IS640 is a LWIR (long wavelength infrared, 7-14 μm) vision system with lock-in thermography for non-destructive failure analyses in microelectronic devices, electronic assembly and for thermal mapping.

Capacities

  • PC controlled
  • Lock-in thermography
  • Thermography and true temperature mapping
  • Temperature resolution, less than 0.01°C
  • Heat dissipation detection, at least 10 μW
  • IR vision system, with spatial resolution (X and Y) up to 5 μm
  • Sample positioner of 100x100 mm² with thermal stage up to 80°C
  • Probe station with 2 micro-probes positioners
  • ESD protection.

Applications

Thermal imaging system Sentris IS640 is used for:

  • non-destructive failure analyses on varieties microelectronic devices such as IC, microsystems, heterogeneous structures, SMD passive, packaged and non-packaged devices; on a backside, a front-side and inside of the devices,
  • lock-in thermography,
  • true temperature mapping,
  • thermal characterization, such thermal resistance,
  • IR high-resolution microscopy.
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