Thermal imaging system
Description
Thermal imaging system Sentris IS640 is an LWIR (long-wavelength infrared, 7 to 14 μm) vision system with lock-in thermography for non-destructive failure analyses in microelectronic devices, electronic assemblies and for thermal mapping.
Specifications
- PC-controlled
- Lock-in thermography
- Thermography and true temperature mapping
- Temperature resolution: less than 0.01°C
- Heat dissipation detection: down to 10 μW
- IR vision system, with spatial resolution (X and Y) down to 5 μm
- Sample positioner of 100x100 mm² with thermal stage up to 80°C
- Probe station with 2 micro-probe positioners
- ESD protection.
Applications
Thermal imaging system Sentris IS640 is used for:
- non-destructive failure analyses on a variety of microelectronic devices such as ICs, microsystems, heterogeneous structures, passive SMD components, packaged and non-packaged devices; from the backside, the front side and inside of the devices,
- lock-in thermography,
- true temperature mapping,
- thermal characterization, such as thermal resistance,
- IR high-resolution microscopy.
